I-1.integrated Design of Optical Metallographic Microscope nama-atomic force microscope, imisebenzi enamandla
2.Kunokubili imaphimba-microscope nama-atomic force microscope ukucabanga kwemifanekiso yokucabanga, zombili ezingasebenza ngasikhathi sinye ngaphandle kokuthintana
3.T ngasikhathi sinye, inemisebenzi yokulinganisa okungama-timenceal ezimbili kanye nama-atomic force microscope isilinganiso ezintathu ubukhulu
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7. Indlela yokulungisa inaliti yokudla ye-Piezoelectric Reconded Piezoelectrised Peozoelectric Ceramic Cuetholped Persongiser Retach Detection ethomathishini etholwayo ivikela uphenyo kanye nesampula
8. Uhlelo lokuma olukhulu kakhulu lwe-Ultra-High-High
9. I-Intenner Scanner Ukulungiswa komsebenzisi Isihleli, Isimo se-Nanometer kanye nokunemba kokukalwa okungcono kune-98%
Ukucaciswa:
| Imodi yokusebenza | Imodi yokuthinta, imodi ye-TAP |
| Imodi yokuzikhethela | Frict / Force Force, Amplitude / Isigaba, amandla kazibuthe / ama-electrostatic |
| Force Spectrum Curve | Fz Force Curve, RMS-Z Curve |
| Ibanga le-XY SCAN | 50 * 50um, okukhethwayo 20 * 20um, 100 * 100um |
| Ukwakhiwa kwe-Z Scan | 5um, Okokuzithandela 2um, 10um |
| Scan resolution | I-Horilontal 0.2nm, mpo 0.05nm |
| Usayizi wesampula | Φ≤≤8mm, H≤20mm |
| Ukuhamba kwesiteji sesampula | 25 * 25mm |
| I-Optical Elepiece | Eliyo |
| Injongo ye-Optical | I-5X / 10X / 20X / 50X Plan Acochromatic Izinjongo |
| Indlela yokukhanyisa | ULe Kohler Lighting System |
| Ukugxila kwe-Optical | Ukugxila kwencwajana enolaka |
| Ikhamera | I-5MP CMOS Sensor |
| bonisa | 10.1 Inch I-Flat Panel Display ene-Graph Ukulinganisa Umsebenzi Wokulinganisa |
| Skena Speed | 0.6hz-30hz |
| Skena Angle | 0-360 ° |
| Indawo yokusebenza | Uhlelo lweWindows XP / 7/8/1 10 |
| Isikhombimsebenzisi esibonakalayo | I-USB2.0 / 3.0 |
